|
|
Workpackage 1: Physical modeling and understanding of the variability at 45/32 nm technology nodes. Workpackage 2: Flow definition and framework set up for variability characterization. Correlated variability energy timing flow definition and set up. Workpackage 3: Description of the variability analysis methods at circuit level. Demonstration of the development method on SRAM circuits Workpackage 4: Software techniques for flexible data and workload Workpackage 5: Integration, definition of characterization blocks, macro-cells and system level architecture Workpackage 6: Identification of relevant industrial applications, associated requirements and evaluation metrics |
|
|