Forthcoming FIB related conferences

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• 5th Annual FIB SEM Workshop
  24 February 2012, Carnegie Institution of Washington, Washington DC.

• Interdisciplinary Symposium on 3D Microscopy
  5-8 March.2012, Les Diablerets, Switzerland

• 7. FIB-Workshop DACH: Focused Ion Beams in Research, Science and Technology (German language)
  25-27 June 2012, Dresden, Germany

• 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - IPFA 2012
  2-6 July 2012, Singapore

• 15th European Microscopy Congress
  16-21 September 2012, Manchester Central, UK.

• European Focused Ion Beam Users Group Meeting, EFUG2012
  1 October 2012, Cagliari, Italy.

• 23rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF2012
  1-5 October 2012, Cagliari, Italy.

• 38th Int. Symposium for Testing and Failure Analysis, ISTFA2012
  11-15 November 2012, Phoenix, Arizona, US