16th European FIB Users Group Meeting (EFUG2012)
Monday 1st October 2012, Cagliari, Sardinia, Italy.
The 16th European Focused Ion Beam Users Group (EFUG2012) meeting will be a one day meeting before the
ESREF2012
conference.
Topics for the meeting :
- Device modification and gas assisted FIB
- Developments in FIB instrumentation
- FIB for failure and materials analysis
- TEM sample preparation
- Micromachining
- Life-science applications
Each session will be composed of short presentations ( 5-10 slides) by FIB users. Contributions are welcomed discussing novel applications, new materials (Cu, low-k), new procedures, case studies, new instrumentation, or basic understanding of the FIB processes. The meeting is intended to stimulate discussion and to exchange ideas and practical knowledge. Hence presentations on open questions and unresolved problems are highly welcomed ! Submit your abstract (title, authors, affiliation, 10 lines text) electronically (MSWord) to Richard Langford. All participants are strongly encouraged to display a mini-poster showing results or problems encountered in daily FIB-life. (Poster size : one A3 portrait page, i.e. one picture + title + authors + short explanation, font 24 pt). These displays will be the starting point for the informal discussion session and will help to stimulate the interaction between the participants.
The presentations and posters will be published on the EFUG website after the meeting.
Abstract submission and registration :
Please contact Richard Langford, rml42[add]cam.ac.uk, University of Cambridge, by e-mail for :
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submission of title and 10-lines abstract to present your work at the meeting
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title of mini-poster to present at the meeting.
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registration for the meeting : participation is free. Please register in advance for logistical reasons.
Contact : European FIB Users Group 